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Keithley Instruments Inc.

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纳米电子器件－纳米电子及单电子I-V曲线

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Model 2400 General-Purpose SourceMeter w/ Measurements up to 200V and 1A, 20W Power Output

Model 4200-SCS Semiconductor Characterization System - Leading-Edge Pulse Capability Integrated with Precision DC Measurement for the 65nm Node and Beyond

Model 6430 Sub-Femtoamp Remote SourceMeter