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Keithley Instruments Inc.

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新技术－RF/DC, SOC, FeRAMs, MRAMS, LCD-TEGs

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Products

Model 4200-SCS Semiconductor Characterization System - Leading-Edge Pulse Capability Integrated with Precision DC Measurement for the 65nm Node and Beyond

S600 Series Parametric Test Systems

S400DC/RF Single-insertion RF and DC Test Solution