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Today's new materials, miniscule device dimensions, and higher operating speeds are making device characterization more challenging than ever. Traditional DC I-V techniques can lead to joule heating of the device, which affects device response. This guide to high speed, high accuracy DC and pulse testing contains educational seminars, product demonstrations, and product tours, as well as applications notes, articles, white papers, and other reference literature to provide insight into minimizing the amount of energy pumped into a device and valuable alternatives to DC characterization methods with Keithley's growing line of pulse solutions.
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