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Application Notes White Papers Presentations Manuals Data Sheet

Keithley has more than 60 years of experience in solving the most demanding measurement problems. We've developed this Semiconductor Device Test Applications Guide to help Series 2600/2600A System SourceMeter instrument users who want to create their own test scripts using the Test Script Builder software. This software can be downloaded at no charge from our website.

In addition to the Semiconductor Device Test Applications Guide, this page provides links to a variety of informative data sheets, application notes, white papers, and presentations on Series 2600 products. Use them to discover how to reduce your cost of test while simplifying the most challenging applications. If you have configuration questions, Keithley's applications engineers are available to assist you.


Application Notes
  • Upgrading from Series 2600 System SourceMeter Instruments to Series 2600A
  • 2814 On-The-Fly Vth Measurement for Bias Temperature Instability Characterization
  • 2639 Production Testing of High Intensity, Visible LEDs using the Series 2600A System SourceMeter Instrument
  • 2647 IDDQ Testing and Standby Current Testing with Series 2600A System SourceMeter Instrument
  • 2605 Increasing Production Throughput of Multi-pin Devices with Keithley Series 2600A System SourceMeter Instrument
  • 2614 Creating Scaleable, Multipin, Multi-Function IC Test Systems Using the Model 2602 System SourceMeter Instrument
  • 2626 High Throughput DC Production Testing of Laser Diode Modules and VCSELs with the Model 2602 System SourceMeter Instrument
  • 2633 Diode Production Testing with Series 2600A
  • 2846 ACS Integrated Test System for Lab-Based Automation
  • 2845 ACS Integrated Test System for Multi-Site Parallel Test
  • 2848 ACS Integrated Test System for NBTI Testing
  • 2847 Integrated Test System for High Throughput WLR Testing
  • 2616 Converting a Series 2400 SourceMeter SCPI Application to a Series 2600 System SourceMeter Script Application
  • 2889 Optimizing Switched Measurements with the Series 3700 System Switch/Multimeter and Series 2600A Through the Use of TSP
  • Setting the Timeout in an IVI Driver
  • Presentations
  • Test Script Processor (TSP) Technology / TSP On-board Test Script Processor / Product Intro
  • Test Script Builder software tool to create, modify, debug, and store TSP test scripts / Online Demo
  • Series 2600A SourceMeter® Instruments / Product Intro
  • Models 2601 and 2602 SourceMeter® Instruments / Product Tour
  • Models 2611 and 2612 SourceMeter® Instruments (200V) / Product Tour
  • Models 2635 and 2636 SourceMeter® Instruments (Low Current) / Product Tour
  • White Papers
  • New Test Sequencing Instruments Lower Cost of Test for Device Manufacturers - Chinese Language Version
  • New Test Sequencing Instruments Lower Cost of Test for Device Manufacturers
  • LXI Clears the Way to Smarter Instruments
  • Manuals
  • Series 2600A System SourceMeter Reference Manual
  • Series 2600A System SourceMeter User's Manual
  • Series 2600A System SourceMeter Quick Start Guide
  • Data Sheet
  • Series 2600A System SourceMeter Data Sheet