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首页 / 近期新闻 / 专题研讨会和会议 / Online Seminar Registration Forms / Understanding Reliability Testing of Semiconductor Devices

Understanding Reliability Testing of Semiconductor Devices

This seminar discusses the need for and implementation of stress-measure reliability testing in leading-edge semiconductor development. Examples of common tests and techniques currently used to guarantee reliable devices and manufacturing are given, with underlying failure mechanisms explained.

By participating in this seminar you will learn and understand:

  • The relevance and importance of stress-measure testing in semiconductor design
  • Common stress-measure tests and techniques in use today
  • Failure mechanisms and their relative importance
  • Measurement solutions used for stress-measure testing
This seminar is recommended for Semiconductor Device and Process Engineers who wish to gain a better understanding of the effects of degradation on modern device lifetimes.

Dave Rubin, Senior Industry Market Manager, presents the seminar.

Event Length: Approximately 40 minutes