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Recent Webcasts

Tips, Tricks, and Traps of Semiconductor

Capacitance-Voltage (C-V) Testing

This seminar follows up on the material presented in the Semiconductor C-V Testing Fundamentals seminar (link to the previous seminar). It is designed to help laboratory engineers implement, troubleshoot, and verify C-V measurement systems. The seminar will discuss the keys to getting good C-V measurement results. Topics to be discussed include system setup and results from some extended C-V applications, such as high voltage C-V and quasistatic C-V.

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How to Get the Most from

Your Low Current Measurement Instruments

This seminar is designed to cover the the basics of low current (from nA to fA) electrical measurements, including how to select the right current measurement instrument, practical ways to reduce current noise in measurement setups, and how to quantify subtle sources of noise. These measurement best practices are important for applications in semiconductor material/device characterization, nanoscience test and measurement, optoelectronic device characterization, and many more. Application examples where such sensitive measurements are required will be discussed, together with a discussion of recent innovative test equipment solutions.

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Advanced Measurement Techniques

for OFDM and MIMO Based Systems

Advanced OFDM (Orthogonal Frequency Division Multiplex) technologies impose additional challenges and requirements for testing new wireless communication devices and systems. This paper compares and contrasts traditional single-carrier modulation schemes with multi-carrier OFDM schemes to understand the test equipment and measurement considerations when using modern vector signal generators and analyzers. It covers in detail spectrum, power, and modulation quality measurements and techniques for R&D and high-speed production test applications. The paper covers testing of both SISO (single-input, single-output) and MIMO (multiple-input, multiple-output) communications systems used in 802.11n WLAN, 802.16e mobile-WiMAX Wave 2, which are also applicable to future LTE and UMB cellular standards.  Note: This is Part Two of a two-part seminar.  See below for Part One:  "An Introduction to Orthogonal Frequency Division Multiplex Technology".

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Parallel Wafer Level Reliability (WLR) Basics 

This seminar is focused on examining the benefits and tradeoffs associated with parallel test solutions for wafer level reliability (WLR.) WLR tests are commonly used throughout the semiconductor lifecycle from technology development and process integration, to process reliability monitoring. The speed and accuracy of the WLR testing significantly impacts time to market for new designs. Parallel WLR testing provides a tool to significantly accelerate throughput by providing statistically significant samples sooner. Parallel WLR test solutions provide throughput benefits for both traditional and advance WLR measurements.

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An Introduction to Orthogonal Frequency
Division Multiplex Technology

Commercial radio technology has reached a new inflection point. The communications market and the underlying technology that provides voice and data services are evolving to provide higher data rates in the same frequency spectrum to ever more users. This seminar provides an overview of the changes occurring in the RF communications industry and the new technologies being developed: OFDM (Orthogonal Frequency Division Multiplex), OFDMA (Orthogonal Frequency Division Multiple Access), and MIMO (multiple-input, multiple-output). It covers the fundamentals of these new technologies, shows how these technologies are used in the WiMAX and WLAN standards, and discusses the test challenges and new test techniques for these technologies.  Note: This is Part One of a two-part seminar.  See  above for Part Two:  "Advanced Measurement Techniques for OFDM and MIMO Based Systems".

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Meet new challenges of semiconductor parameters measurement-ACS Keithley solution

THIS SEMINAR IS PRESENTED IN CHINESE ONLY

With the development of semiconductor foundry step into 45nm process, High-K/ metal gate material are commonly used. Whether test engineers in IC design house or in foundry, they all face more and more big challenges because of the never-ending changes and improvement of the new technologies.

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Semiconductor Capacitance-Voltage (C-V) Testing Fundamentals Webcast

This seminar is designed to introduce the topic of C-V measurements as they relate to semiconductor device and materials characterization. C-V testing is commonly used to determine semiconductor parameters such as doping profiles, density of interface states, threshold voltages, oxide charge, and carrier lifetime.  This informative 45-minute seminar is followed by an interactive Q&A (during live broadcast only) where you can ask the presenter for additional insight on this important topic.

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Design Considerations for Maximizing Throughput and Accuracy in Switch/Measure Instrumentation

This seminar offers insights into the speed vs. accuracy trade-offs involved in making multi-channel measurements with a digital multimeter (DMM) and relay switching. We’ll explore the various interactions between these instruments, such as signal errors caused by switching hardware, improper instrument coordination, measurement compensation techniques, and automated scanning. 
Click here to register and view this seminar. 

 

Archived Webcasts

General Test and Measurement

• Do More with Pulses: Practical Tips and Methods for Getting the Most from Today's Pulse Generators
  
• Understanding the Subtleties of Specifying and Applying a 6-1/2 digit DMM (Click here to register and view this seminar in Chinese)

• Increasing Functional Test Throughput Using Distributed Processing Techniques
  
• Reducing Test Time with Distributed Programming in PXI, LXI, TSP^TM, and GPIB Hybrid Systems
  
• Advances in Testing: New Techniques For Reducing Cost of Test
• Easier, Faster, Simpler Bench Top Design Verification
• Understanding Temperature Measurements
• Understanding Measurement Uncertainty
• Understanding the Basics of Switching Systems
• Ethernet-Based Precision Instrumentation, Introductory Course
• DC Voltage Measurements, Introductory Course

Low Level Measurements

• How to Get the Most from Your Low Current Measurement Instruments
• How to Make Accurate Resistance Measurements
• 4 Steps to Precision Measurements
• Reducing Voltage Noise and Error in Challenging Measurements
• How to Make Sensitive DC Measurements

Nanotechnology

• Advanced Particle Beam Methods for Nano-Characterization and Analysis
• In-situ Correlation of Mechanical Properties, deformation Behavior, and Electrical Characteristics of Materials Using Conductive Nanoindentation
• How to Avoid Self-Heating Effects on Nanoscale Devices
• Give Your Microscope a Hand: Characterization of Nano Structures
• Electronic Properties of Zinc-Blende Wurtzite Biphasic Gallium Nitride Nanowires and Nano FETs
• Measurement Needs in Nano-Architectonics
• Making Successful Electrical Measurements on Nanoscale Materials and Devices 
• Techniques for Accurate Nanotech Electrical Measurements

Semiconductor

• "Smart" TDDB Algorithm for Investigating Degradation in High-κ Gate Stacks Under Constant Voltage Stress
  

• How Dual Channel Pulse Testing Simplifies Characterizing RF Transistors

• Understanding Advanced Reliability Testing
• RF Device Testing Devices Using Synchronized Pulsed -DC and -RF Signals
  
• Meeting New Challenges in Wafer Level Reliability Testing using Source Measure Units (SMUs)
• Pulsed Characterization of Advanced CMOS Technologies
• Parallel High Throughput WLR Testing for Advanced Gate Dielectrics
• Automated production RF-CV measurements of advanced gates dielectrics for 65nm node and beyond
• Overcoming Gate Oxide Scaling Challenges in Semi. Reliability Testing
• New Measurement Techniques for Improving Semi. Device Reliability
• Understanding Reliability Testing of Semiconductor Devices
• Tips, Tricks, and Traps for Advanced SMU DC Measurements
• How to Make DC Parametric Measurements

Wireless/RF

• Software-Defined Radio Architecture and Next-Generation RF Instrumentation

• Understanding High Accuracy Wireless Measurements

• Fast Transient Supplies for Cellular Phone Tests

Other Seminars

• How to Optimize Laser Diode Parametric Test Throughput

• Making AST Work for You: Compressing the Time for Effective Stress Testing
• Hints and Tips for Electrical and Optical Characterization of OLEDs