首页 / 近期新闻 / 展会 / 2008 IEEE Sarnoff Symposium

2008 IEEE Sarnoff Symposium

Document Actions
April 29, 2008. Since 1978 the IEEE Sarnoff Symposium has been bringing together a tremendous and rich diversity of telecom experts from industry, universities, and government.

Show Dates: April 29, 2008


Location: Princeton, NJ

Facility: Princeton University & Nassau Inn




Since 1978 the IEEE Sarnoff Symposium has been bringing together a tremendous and rich diversity of telecom experts from industry, universities, and government. The popularity of the Sarnoff Symposium, again being held in the historic Nassau Inn located in the heart of downtown Princeton, continues to grow as the premier forum for researchers, engineers, and business executives in the North East drawing an attendance from all over the world. Beside the technical paper presentations the Symposium will include tutorials, student paper poster presentations, executive panels, and exhibitions.


Keithley experts will be on hand to discuss your measurement needs and challenges.




Demonstrations of Keithley Products will include:


Keithley Tutorial

Monday, April 28, 2008  13:00-15:30

Convocation Room of the Friends Center at Princeton University

An Introduction to Orthogonal Frequency Division Multiplex Technology

Presented by: Rod Sugiyama, Manager, RF Signal Sources, Keithley Instruments


Commercial radio technology has reached a new inflection point. The communications market and the underlying technology that provides voice and data services are evolving to provide higher data rates in the same frequency spectrum to ever more users. This presentation provides an overview of the changes occurring in the RF communications industry and the new technologies being developed: OFDM (Orthogonal Frequency Division Multiplex), OFDMA (Orthogonal Frequency Division Multiple Access), and MIMO (Multiple-Input, Multiple-Output). It covers the fundamentals of these new technologies, shows how these technologies are used in the WiMAX and WLAN standards, and discusses the test challenges and new test techniques for these technologies.

Note: You must register to attend this event. Click here for registration information.



General Show Information: click here

 

To register for free hall pass: Coming soon!











上次修改时间: 2008-04-04